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6 · "Futurama" Lethal Inspection (TV Episode 2010)

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In the episode Bender learns that he suffers from a terminal manufacturing defect, effectively rendering him mortal. Bender must cope with his newfound mortality and enlists Hermes Conrad's help to track down the mysterious quality inspector, Inspector No. 5, whom he blames for allowing him to enter the . See more"Lethal Inspection" is the sixth episode in the sixth season of the American animated television series Futurama, and the 94th episode of the series . See more

After a reenactment of the "Sith-al War", Bender touts his perfection and "immortality", specifically citing his ability to download a backup copy of himself . See moreFrom June 8 to June 15, as part of its 2010 "Countdown to Futurama" event, Comedy Central Insider, Comedy Central's news outlet, released various preview materials for the episode, including a storyboard of Bender's and Hermes' entry into the Central . See more"Lethal Inspection" originally aired on July 22, 2010 on Comedy Central. In its original American broadcast, it was viewed by an estimated 1.920 million viewers. The episode had a 1.3 rating/2% share in Nielsen ratings and a 0.9 rating/3% share in the 18–49 . See more• Television portal• Death• Stages of grief See more

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• "Lethal Inspection" at IMDb• "Lethal Inspection" at the Infosphere, the Futurama Wiki. See more Applied Materials, ASML/HMI and others are developing new e-beam inspection tools and/or techniques to solve some of the more difficult defect issues in the fab. E-beam .However, after discovering and fixing an oil leak, Bender learns that he is missing the back-up unit because of a production defect. Hermes agrees to join him in his quest to discover the identity .

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ASML operates in 3 main e-beam categories: metrology, voltage contrast defect inspection, and physical defect inspection. Using SE (secondary electron) and BSE (back .Subject to the full terms and detailed information on obtaining service available at https://www.apple.com/legal/warranty/ and https://support.apple.com/, if you submit a valid .The first generation multiple e-beam (multibeam) wafer inspection tool for in-line defect inspection applications. HMI, formerly known as Hermes Microvision Inc., is an integral part of ASML as a . Due to a critical defect, Bender finds that he has no back-up copy and is therefore mortal. With Hermes' help, he sets out to search the Central Bureaucracy for any trace of the robot inspector who missed the defect in .

Lethal Inspection

Discover all the collections of Hermès, fashion accessories, scarves and ties, belts and ready-to-wear, perfumes, watches and jewelry.The eP5 combines precise CD metrology with high-resolution defect detection in one system. For wafer inspection, it can operate in both physical defect and voltage contrast mode to detect .In the episode Bender learns that he suffers from a terminal manufacturing defect, effectively rendering him mortal. Bender must cope with his newfound mortality and enlists Hermes Conrad's help to track down the mysterious quality inspector, Inspector No. 5, whom he blames for allowing him to enter the world only to die.

Flashbacks reveal that Hermes worked as an inspector at the Tijuana manufacturing plant; when Bender came off the line, Hermes found the production defect, but faced with the choice to scrap the infant robot for his flaw, Hermes chose instead to certify Bender and give him a chance at life. Applied Materials, ASML/HMI and others are developing new e-beam inspection tools and/or techniques to solve some of the more difficult defect issues in the fab. E-beam inspection is one of two ways to find defects on a wafer. Optical inspection is the other method.

However, after discovering and fixing an oil leak, Bender learns that he is missing the back-up unit because of a production defect. Hermes agrees to join him in his quest to discover the identity of Inspector #5, leaving Leela in charge of all bureaucratic business. ASML operates in 3 main e-beam categories: metrology, voltage contrast defect inspection, and physical defect inspection. Using SE (secondary electron) and BSE (back-scattered electron) to form images for inspection/metrology purpose. Application Metrology.

Subject to the full terms and detailed information on obtaining service available at https://www.apple.com/legal/warranty/ and https://support.apple.com/, if you submit a valid claim under this warranty, Apple will either repair, replace, .

The first generation multiple e-beam (multibeam) wafer inspection tool for in-line defect inspection applications. HMI, formerly known as Hermes Microvision Inc., is an integral part of ASML as a leader in e-beam inspection equipment for the semiconductor industry.

Due to a critical defect, Bender finds that he has no back-up copy and is therefore mortal. With Hermes' help, he sets out to search the Central Bureaucracy for any trace of the robot inspector who missed the defect in order to get revenge.

Discover all the collections of Hermès, fashion accessories, scarves and ties, belts and ready-to-wear, perfumes, watches and jewelry.The eP5 combines precise CD metrology with high-resolution defect detection in one system. For wafer inspection, it can operate in both physical defect and voltage contrast mode to detect patterning and electrical defects.In the episode Bender learns that he suffers from a terminal manufacturing defect, effectively rendering him mortal. Bender must cope with his newfound mortality and enlists Hermes Conrad's help to track down the mysterious quality inspector, Inspector No. 5, whom he blames for allowing him to enter the world only to die. Flashbacks reveal that Hermes worked as an inspector at the Tijuana manufacturing plant; when Bender came off the line, Hermes found the production defect, but faced with the choice to scrap the infant robot for his flaw, Hermes chose instead to certify Bender and give him a chance at life.

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Applied Materials, ASML/HMI and others are developing new e-beam inspection tools and/or techniques to solve some of the more difficult defect issues in the fab. E-beam inspection is one of two ways to find defects on a wafer. Optical inspection is the other method.However, after discovering and fixing an oil leak, Bender learns that he is missing the back-up unit because of a production defect. Hermes agrees to join him in his quest to discover the identity of Inspector #5, leaving Leela in charge of all bureaucratic business.

ASML operates in 3 main e-beam categories: metrology, voltage contrast defect inspection, and physical defect inspection. Using SE (secondary electron) and BSE (back-scattered electron) to form images for inspection/metrology purpose. Application Metrology.

Subject to the full terms and detailed information on obtaining service available at https://www.apple.com/legal/warranty/ and https://support.apple.com/, if you submit a valid claim under this warranty, Apple will either repair, replace, .The first generation multiple e-beam (multibeam) wafer inspection tool for in-line defect inspection applications. HMI, formerly known as Hermes Microvision Inc., is an integral part of ASML as a leader in e-beam inspection equipment for the semiconductor industry. Due to a critical defect, Bender finds that he has no back-up copy and is therefore mortal. With Hermes' help, he sets out to search the Central Bureaucracy for any trace of the robot inspector who missed the defect in order to get revenge.

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Discover all the collections of Hermès, fashion accessories, scarves and ties, belts and ready-to-wear, perfumes, watches and jewelry.

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